Time-of-flight based pixel architecture with integrated double-cathode photodetector

Klaus Oberhauser; Gerald Zach; Alexander Nemecek; Horst Zimmermann

doi:10.1117/12.725655

Time-of-flight based pixel architecture with integrated double-cathode photodetector

Klaus Oberhauser
, Gerald Zach
, Alexander Nemecek
, Horst Zimmermann

TU Wien

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	Optical Measurement Systems for Industrial Inspection V
Edition	PART 1
DOIs	https://doi.org/10.1117/12.725655
Publication status	Published - 2007
Externally published	Yes
Event	Optical Measurement Systems for Industrial Inspection V - Munich, Germany Duration: 18 Jun 2007 → 22 Jun 2007

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Number	PART 1
Volume	6616
ISSN (Print)	0277-786X

Conference

Conference	Optical Measurement Systems for Industrial Inspection V
Country/Territory	Germany
City	Munich
Period	18/06/07 → 22/06/07

Keywords

OEIC
Optical distance measurement
Opto-electronic correlation
PIN photodetector
Time-of-flight

Access to Document

10.1117/12.725655

Cite this

@inproceedings{62a70d27b7e24f43a5b1003874f4e1ae,

title = "Time-of-flight based pixel architecture with integrated double-cathode photodetector",

keywords = "OEIC, Optical distance measurement, Opto-electronic correlation, PIN photodetector, Time-of-flight",

author = "Klaus Oberhauser and Gerald Zach and Alexander Nemecek and Horst Zimmermann",

year = "2007",

doi = "10.1117/12.725655",

language = "English",

isbn = "0819467588",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

number = "PART 1",

booktitle = "Optical Measurement Systems for Industrial Inspection V",

edition = "PART 1",

note = "Optical Measurement Systems for Industrial Inspection V ; Conference date: 18-06-2007 Through 22-06-2007",

}

Oberhauser, K, Zach, G, Nemecek, A & Zimmermann, H 2007, Time-of-flight based pixel architecture with integrated double-cathode photodetector. in Optical Measurement Systems for Industrial Inspection V. PART 1 edn, 66160C, Proceedings of SPIE - The International Society for Optical Engineering, no. PART 1, vol. 6616, Optical Measurement Systems for Industrial Inspection V, Munich, Germany, 18/06/07. https://doi.org/10.1117/12.725655

Time-of-flight based pixel architecture with integrated double-cathode photodetector. / Oberhauser, Klaus; Zach, Gerald; Nemecek, Alexander et al.
Optical Measurement Systems for Industrial Inspection V. PART 1. ed. 2007. 66160C (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 6616, No. PART 1).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Time-of-flight based pixel architecture with integrated double-cathode photodetector

AU - Oberhauser, Klaus

AU - Zach, Gerald

AU - Nemecek, Alexander

AU - Zimmermann, Horst

PY - 2007

Y1 - 2007

KW - OEIC

KW - Optical distance measurement

KW - Opto-electronic correlation

KW - PIN photodetector

KW - Time-of-flight

UR - https://www.scopus.com/pages/publications/36248962730

U2 - 10.1117/12.725655

DO - 10.1117/12.725655

M3 - Conference contribution

AN - SCOPUS:36248962730

SN - 0819467588

SN - 9780819467584

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Optical Measurement Systems for Industrial Inspection V

T2 - Optical Measurement Systems for Industrial Inspection V

Y2 - 18 June 2007 through 22 June 2007

ER -

Time-of-flight based pixel architecture with integrated double-cathode photodetector

Publication series

Conference

Keywords

Access to Document

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Cite this