Thermal investigations on CMOS integrated micro-hot-plates using IR thermography

Christian Schmidt; Frank Altmann; Giorgio C. Mutinati; Elise Brunet; Stephan Steinhauer; Anton Koeck; Martin Siegele; Christoph Gamauf; Alexander Nemecek; J. Teva; J. Kraft; J. Siegert; F. Schrank; Hans Kruschke

Thermal investigations on CMOS integrated micro-hot-plates using IR thermography

Christian Schmidt
, Frank Altmann
, Giorgio C. Mutinati
, Elise Brunet
, Stephan Steinhauer
, Anton Koeck
, Martin Siegele
, Christoph Gamauf
, Alexander Nemecek
, J. Teva
, J. Kraft
, J. Siegert
, F. Schrank
, Hans Kruschke

University of Applied Sciences Wiener Neustadt

Fraunhofer-Institute for Mechanics of Materials IWM Halle
Austrian Institute of Technology
University of Applied Sciences
ams AG
Infratec GmbH

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Citation (Scopus)

Original language	English
Title of host publication	ISTFA 2012 - Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis
Publisher	ASM International
Pages	592-595
Number of pages	4
ISBN (Print)	9781615039791
Publication status	Published - 2012
Event	38th International Symposium for Testing and Failure Analysis, ISTFA 2012 - Phoenix, AZ, United States Duration: 11 Nov 2012 → 15 Nov 2012

Publication series

Name	Conference Proceedings from the International Symposium for Testing and Failure Analysis

Conference

Conference	38th International Symposium for Testing and Failure Analysis, ISTFA 2012
Country/Territory	United States
City	Phoenix, AZ
Period	11/11/12 → 15/11/12

Cite this

Schmidt, C., Altmann, F., Mutinati, G. C., Brunet, E., Steinhauer, S., Koeck, A., Siegele, M., Gamauf, C., Nemecek, A., Teva, J., Kraft, J., Siegert, J., Schrank, F., & Kruschke, H. (2012). Thermal investigations on CMOS integrated micro-hot-plates using IR thermography. In ISTFA 2012 - Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis (pp. 592-595). (Conference Proceedings from the International Symposium for Testing and Failure Analysis). ASM International.

Schmidt, Christian ; Altmann, Frank ; Mutinati, Giorgio C. et al. / Thermal investigations on CMOS integrated micro-hot-plates using IR thermography. ISTFA 2012 - Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis. ASM International, 2012. pp. 592-595 (Conference Proceedings from the International Symposium for Testing and Failure Analysis).

@inproceedings{a1c5f589ed654070bc595dbb40e6a5e3,

title = "Thermal investigations on CMOS integrated micro-hot-plates using IR thermography",

author = "Christian Schmidt and Frank Altmann and Mutinati, \{Giorgio C.\} and Elise Brunet and Stephan Steinhauer and Anton Koeck and Martin Siegele and Christoph Gamauf and Alexander Nemecek and J. Teva and J. Kraft and J. Siegert and F. Schrank and Hans Kruschke",

year = "2012",

language = "English",

isbn = "9781615039791",

series = "Conference Proceedings from the International Symposium for Testing and Failure Analysis",

publisher = "ASM International",

pages = "592--595",

booktitle = "ISTFA 2012 - Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis",

note = "38th International Symposium for Testing and Failure Analysis, ISTFA 2012 ; Conference date: 11-11-2012 Through 15-11-2012",

}

Schmidt, C, Altmann, F, Mutinati, GC, Brunet, E, Steinhauer, S, Koeck, A, Siegele, M, Gamauf, C, Nemecek, A, Teva, J, Kraft, J, Siegert, J, Schrank, F & Kruschke, H 2012, Thermal investigations on CMOS integrated micro-hot-plates using IR thermography. in ISTFA 2012 - Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis. Conference Proceedings from the International Symposium for Testing and Failure Analysis, ASM International, pp. 592-595, 38th International Symposium for Testing and Failure Analysis, ISTFA 2012, Phoenix, AZ, United States, 11/11/12.

Thermal investigations on CMOS integrated micro-hot-plates using IR thermography. / Schmidt, Christian; Altmann, Frank; Mutinati, Giorgio C. et al.
ISTFA 2012 - Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis. ASM International, 2012. p. 592-595 (Conference Proceedings from the International Symposium for Testing and Failure Analysis).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Thermal investigations on CMOS integrated micro-hot-plates using IR thermography

AU - Schmidt, Christian

AU - Altmann, Frank

AU - Mutinati, Giorgio C.

AU - Brunet, Elise

AU - Steinhauer, Stephan

AU - Koeck, Anton

AU - Siegele, Martin

AU - Gamauf, Christoph

AU - Nemecek, Alexander

AU - Teva, J.

AU - Kraft, J.

AU - Siegert, J.

AU - Schrank, F.

AU - Kruschke, Hans

PY - 2012

Y1 - 2012

UR - https://www.scopus.com/pages/publications/84874296689

M3 - Conference contribution

AN - SCOPUS:84874296689

SN - 9781615039791

T3 - Conference Proceedings from the International Symposium for Testing and Failure Analysis

SP - 592

EP - 595

BT - ISTFA 2012 - Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis

PB - ASM International

T2 - 38th International Symposium for Testing and Failure Analysis, ISTFA 2012

Y2 - 11 November 2012 through 15 November 2012

ER -

Schmidt C, Altmann F, Mutinati GC, Brunet E, Steinhauer S, Koeck A et al. Thermal investigations on CMOS integrated micro-hot-plates using IR thermography. In ISTFA 2012 - Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis. ASM International. 2012. p. 592-595. (Conference Proceedings from the International Symposium for Testing and Failure Analysis).

Thermal investigations on CMOS integrated micro-hot-plates using IR thermography

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