Reusable event types for models at runtime to support the examination of runtime phenomena

Michael Szvetits; Uwe Zdun

doi:10.1109/MODELS.2015.7338230

Reusable event types for models at runtime to support the examination of runtime phenomena

Michael Szvetits
, Uwe Zdun

University of Applied Sciences Wiener Neustadt

Software Engineering Group
University of Vienna

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	2015 ACM/IEEE 18th International Conference on Model Driven Engineering Languages and Systems, MODELS 2015 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	4-13
Number of pages	10
ISBN (Electronic)	9781467369084
DOIs	https://doi.org/10.1109/MODELS.2015.7338230
Publication status	Published - 25 Nov 2015
Event	18th ACM/IEEE International Conference on Model Driven Engineering Languages and Systems, MODELS 2015 - Ottawa, Canada Duration: 30 Sept 2015 → 2 Oct 2015

Publication series

Name	2015 ACM/IEEE 18th International Conference on Model Driven Engineering Languages and Systems, MODELS 2015 - Proceedings

Conference

Conference	18th ACM/IEEE International Conference on Model Driven Engineering Languages and Systems, MODELS 2015
Country/Territory	Canada
City	Ottawa
Period	30/09/15 → 2/10/15

Keywords

events
examination
models
runtime

Access to Document

10.1109/MODELS.2015.7338230

Cite this

Szvetits, M., & Zdun, U. (2015). Reusable event types for models at runtime to support the examination of runtime phenomena. In 2015 ACM/IEEE 18th International Conference on Model Driven Engineering Languages and Systems, MODELS 2015 - Proceedings (pp. 4-13). Article 7338230 (2015 ACM/IEEE 18th International Conference on Model Driven Engineering Languages and Systems, MODELS 2015 - Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MODELS.2015.7338230

Szvetits, Michael ; Zdun, Uwe. / Reusable event types for models at runtime to support the examination of runtime phenomena. 2015 ACM/IEEE 18th International Conference on Model Driven Engineering Languages and Systems, MODELS 2015 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2015. pp. 4-13 (2015 ACM/IEEE 18th International Conference on Model Driven Engineering Languages and Systems, MODELS 2015 - Proceedings).

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title = "Reusable event types for models at runtime to support the examination of runtime phenomena",

keywords = "events, examination, models, runtime",

author = "Michael Szvetits and Uwe Zdun",

note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; 18th ACM/IEEE International Conference on Model Driven Engineering Languages and Systems, MODELS 2015 ; Conference date: 30-09-2015 Through 02-10-2015",

year = "2015",

month = nov,

day = "25",

doi = "10.1109/MODELS.2015.7338230",

language = "English",

series = "2015 ACM/IEEE 18th International Conference on Model Driven Engineering Languages and Systems, MODELS 2015 - Proceedings",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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}

Szvetits, M & Zdun, U 2015, Reusable event types for models at runtime to support the examination of runtime phenomena. in 2015 ACM/IEEE 18th International Conference on Model Driven Engineering Languages and Systems, MODELS 2015 - Proceedings., 7338230, 2015 ACM/IEEE 18th International Conference on Model Driven Engineering Languages and Systems, MODELS 2015 - Proceedings, Institute of Electrical and Electronics Engineers Inc., pp. 4-13, 18th ACM/IEEE International Conference on Model Driven Engineering Languages and Systems, MODELS 2015, Ottawa, Canada, 30/09/15. https://doi.org/10.1109/MODELS.2015.7338230

Reusable event types for models at runtime to support the examination of runtime phenomena. / Szvetits, Michael; Zdun, Uwe.
2015 ACM/IEEE 18th International Conference on Model Driven Engineering Languages and Systems, MODELS 2015 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2015. p. 4-13 7338230 (2015 ACM/IEEE 18th International Conference on Model Driven Engineering Languages and Systems, MODELS 2015 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Szvetits, Michael

AU - Zdun, Uwe

PY - 2015/11/25

Y1 - 2015/11/25

KW - events

KW - examination

KW - models

KW - runtime

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U2 - 10.1109/MODELS.2015.7338230

DO - 10.1109/MODELS.2015.7338230

M3 - Conference contribution

AN - SCOPUS:84961564500

T3 - 2015 ACM/IEEE 18th International Conference on Model Driven Engineering Languages and Systems, MODELS 2015 - Proceedings

SP - 4

EP - 13

BT - 2015 ACM/IEEE 18th International Conference on Model Driven Engineering Languages and Systems, MODELS 2015 - Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 18th ACM/IEEE International Conference on Model Driven Engineering Languages and Systems, MODELS 2015

Y2 - 30 September 2015 through 2 October 2015

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Szvetits M, Zdun U. Reusable event types for models at runtime to support the examination of runtime phenomena. In 2015 ACM/IEEE 18th International Conference on Model Driven Engineering Languages and Systems, MODELS 2015 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2015. p. 4-13. 7338230. (2015 ACM/IEEE 18th International Conference on Model Driven Engineering Languages and Systems, MODELS 2015 - Proceedings). doi: 10.1109/MODELS.2015.7338230

Reusable event types for models at runtime to support the examination of runtime phenomena

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