Results from a beam test of silicon strip sensors manufactured by Infineon Technologies AG

M. Dragicevic; G. Auzinger; U. Bartl; T. Bergauer; S. Gamerith; J. Hacker; A. König; F. Kröner; E. Kucher; J. Moser; T. Neidhart; H. J. Schulze; W. Schustereder; W. Treberspurg; T. Wübben

doi:10.1016/j.nima.2014.04.043

Results from a beam test of silicon strip sensors manufactured by Infineon Technologies AG

M. Dragicevic
, G. Auzinger
, U. Bartl
, T. Bergauer
, S. Gamerith
, J. Hacker
, A. König
, F. Kröner
, E. Kucher
, J. Moser
, T. Neidhart
, H. J. Schulze
, W. Schustereder
, W. Treberspurg
, T. Wübben

Austrian Academy of Sciences
CERN
Infineon Technologies AG, Austria
Infineon Technologies AG

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1-6
Number of pages	6
Journal	Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume	765
DOIs	https://doi.org/10.1016/j.nima.2014.04.043
Publication status	Published - 21 Nov 2014
Externally published	Yes

Keywords

P-on-n
Planar strip sensor
Semiconductor production
Silicon sensor

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10.1016/j.nima.2014.04.043

Cite this

Dragicevic, M., Auzinger, G., Bartl, U., Bergauer, T., Gamerith, S., Hacker, J., König, A., Kröner, F., Kucher, E., Moser, J., Neidhart, T., Schulze, H. J., Schustereder, W., Treberspurg, W., & Wübben, T. (2014). Results from a beam test of silicon strip sensors manufactured by Infineon Technologies AG. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 765, 1-6. https://doi.org/10.1016/j.nima.2014.04.043

@article{40b478a97c744213b79591adc7e11a77,

title = "Results from a beam test of silicon strip sensors manufactured by Infineon Technologies AG",

keywords = "P-on-n, Planar strip sensor, Semiconductor production, Silicon sensor",

author = "M. Dragicevic and G. Auzinger and U. Bartl and T. Bergauer and S. Gamerith and J. Hacker and A. K{\"o}nig and F. Kr{\"o}ner and E. Kucher and J. Moser and T. Neidhart and Schulze, \{H. J.\} and W. Schustereder and W. Treberspurg and T. W{\"u}bben",

note = "Publisher Copyright: {\textcopyright} 2014 Elsevier B.V.",

year = "2014",

month = nov,

day = "21",

doi = "10.1016/j.nima.2014.04.043",

language = "English",

volume = "765",

pages = "1--6",

journal = "Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment",

issn = "0168-9002",

publisher = "Elsevier B.V.",

}

Dragicevic, M, Auzinger, G, Bartl, U, Bergauer, T, Gamerith, S, Hacker, J, König, A, Kröner, F, Kucher, E, Moser, J, Neidhart, T, Schulze, HJ, Schustereder, W, Treberspurg, W & Wübben, T 2014, 'Results from a beam test of silicon strip sensors manufactured by Infineon Technologies AG', Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, vol. 765, pp. 1-6. https://doi.org/10.1016/j.nima.2014.04.043

Results from a beam test of silicon strip sensors manufactured by Infineon Technologies AG. / Dragicevic, M.; Auzinger, G.; Bartl, U. et al.
In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 765, 21.11.2014, p. 1-6.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Results from a beam test of silicon strip sensors manufactured by Infineon Technologies AG

AU - Dragicevic, M.

AU - Auzinger, G.

AU - Bartl, U.

AU - Bergauer, T.

AU - Gamerith, S.

AU - Hacker, J.

AU - König, A.

AU - Kröner, F.

AU - Kucher, E.

AU - Moser, J.

AU - Neidhart, T.

AU - Schulze, H. J.

AU - Schustereder, W.

AU - Treberspurg, W.

AU - Wübben, T.

PY - 2014/11/21

Y1 - 2014/11/21

KW - P-on-n

KW - Planar strip sensor

KW - Semiconductor production

KW - Silicon sensor

UR - https://www.scopus.com/pages/publications/84908376109

U2 - 10.1016/j.nima.2014.04.043

DO - 10.1016/j.nima.2014.04.043

M3 - Article

AN - SCOPUS:84908376109

SN - 0168-9002

VL - 765

SP - 1

EP - 6

JO - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

ER -

Results from a beam test of silicon strip sensors manufactured by Infineon Technologies AG

Keywords

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