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Layout options of spectroscopic X-ray DEPFETs

  • W. Treberspurg
  • , R. Andritschke
  • , A. Bähr
  • , A. Behrens
  • , G. Hauser
  • , P. Lechner
  • , N. Meidinger
  • , J. Müller-Seidlitz
  • , R. H. Richter
  • , J. Treis
  • Max Planck Institute for Extraterrestrial Physics
  • Semiconductor Laboratory of the Max Planck Society

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)
Original languageEnglish
Article numberP08008
JournalJournal of Instrumentation
Volume14
Issue number8
DOIs
Publication statusPublished - 7 Aug 2019
Externally publishedYes

Keywords

  • Detector design and construction technologies and materials
  • Imaging spectroscopy
  • Solid state detectors
  • X-ray detectors and telescopes

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