Electro-thermal simulation of microsystems with mixed abstraction modelling

Mirko Jakovljevic; Peter A. Fotiu; Zeljko Mrcarica; Vanco Litovski; Helmut Detter

doi:10.1016/S0026-2714(01)00024-5

Electro-thermal simulation of microsystems with mixed abstraction modelling

Mirko Jakovljevic
, Peter A. Fotiu
, Zeljko Mrcarica
, Vanco Litovski
, Helmut Detter

Department of Applied & Numerical Mechanics

TU Wien
NXP Semiconductors
University of Nis

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	823-835
Number of pages	13
Journal	Microelectronics Reliability
Volume	41
Issue number	6
DOIs	https://doi.org/10.1016/S0026-2714(01)00024-5
Publication status	Published - Jun 2001

Access to Document

10.1016/S0026-2714(01)00024-5

Cite this

@article{a8f64c7f25154e1baca19716d36df421,

title = "Electro-thermal simulation of microsystems with mixed abstraction modelling",

author = "Mirko Jakovljevic and Fotiu, \{Peter A.\} and Zeljko Mrcarica and Vanco Litovski and Helmut Detter",

year = "2001",

month = jun,

doi = "10.1016/S0026-2714(01)00024-5",

language = "English",

volume = "41",

pages = "823--835",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier Ltd",

number = "6",

}

TY - JOUR

T1 - Electro-thermal simulation of microsystems with mixed abstraction modelling

AU - Jakovljevic, Mirko

AU - Fotiu, Peter A.

AU - Mrcarica, Zeljko

AU - Litovski, Vanco

AU - Detter, Helmut

PY - 2001/6

Y1 - 2001/6

UR - https://www.scopus.com/pages/publications/0035366077

U2 - 10.1016/S0026-2714(01)00024-5

DO - 10.1016/S0026-2714(01)00024-5

M3 - Article

AN - SCOPUS:0035366077

SN - 0026-2714

VL - 41

SP - 823

EP - 835

JO - Microelectronics Reliability

JF - Microelectronics Reliability

IS - 6

ER -

Electro-thermal simulation of microsystems with mixed abstraction modelling

Access to Document

Other files and links

Fingerprint

Cite this