Correlating buried-finger photodetector for time-of-flight applications

G. Zach; A. Nemecek; K. Oberhauser; H. Zimmermann

doi:10.1117/12.827817

Correlating buried-finger photodetector for time-of-flight applications

G. Zach
, A. Nemecek
, K. Oberhauser
, H. Zimmermann

University of Applied Sciences Wiener Neustadt

TU Wien
Institute of Electrodynamics, Microwave and Circuit Design

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Citation (Scopus)

Original language	English
Title of host publication	Optical Measurement Systems for Industrial Inspection VI
DOIs	https://doi.org/10.1117/12.827817
Publication status	Published - 2009
Event	Optical Measurement Systems for Industrial Inspection VI - Munich, Germany Duration: 15 Jun 2009 → 18 Jun 2009

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	7389
ISSN (Print)	0277-786X

Conference

Conference	Optical Measurement Systems for Industrial Inspection VI
Country/Territory	Germany
City	Munich
Period	15/06/09 → 18/06/09

Keywords

OEIC
Optical distance measurement
Opto-electronic correlation
Time-of-flight

Access to Document

10.1117/12.827817

Cite this

@inproceedings{822444f64eb248ddb00a7ad34ab3307a,

title = "Correlating buried-finger photodetector for time-of-flight applications",

keywords = "OEIC, Optical distance measurement, Opto-electronic correlation, Time-of-flight",

author = "G. Zach and A. Nemecek and K. Oberhauser and H. Zimmermann",

year = "2009",

doi = "10.1117/12.827817",

language = "English",

isbn = "9780819476722",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

booktitle = "Optical Measurement Systems for Industrial Inspection VI",

note = "Optical Measurement Systems for Industrial Inspection VI ; Conference date: 15-06-2009 Through 18-06-2009",

}

Zach, G, Nemecek, A, Oberhauser, K & Zimmermann, H 2009, Correlating buried-finger photodetector for time-of-flight applications. in Optical Measurement Systems for Industrial Inspection VI., 738936, Proceedings of SPIE - The International Society for Optical Engineering, vol. 7389, Optical Measurement Systems for Industrial Inspection VI, Munich, Germany, 15/06/09. https://doi.org/10.1117/12.827817

Correlating buried-finger photodetector for time-of-flight applications. / Zach, G.; Nemecek, A.; Oberhauser, K. et al.
Optical Measurement Systems for Industrial Inspection VI. 2009. 738936 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7389).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Correlating buried-finger photodetector for time-of-flight applications

AU - Zach, G.

AU - Nemecek, A.

AU - Oberhauser, K.

AU - Zimmermann, H.

PY - 2009

Y1 - 2009

KW - OEIC

KW - Optical distance measurement

KW - Opto-electronic correlation

KW - Time-of-flight

UR - https://www.scopus.com/pages/publications/69949116485

U2 - 10.1117/12.827817

DO - 10.1117/12.827817

M3 - Conference contribution

AN - SCOPUS:69949116485

SN - 9780819476722

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Optical Measurement Systems for Industrial Inspection VI

T2 - Optical Measurement Systems for Industrial Inspection VI

Y2 - 15 June 2009 through 18 June 2009

ER -

Correlating buried-finger photodetector for time-of-flight applications

Publication series

Conference

Keywords

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