@article{723674628c7f4dca86605671dd04bbab,
title = "Backside doping profiles of irradiated silicon detectors",
keywords = "Radiation damage evaluation methods, Radiation damage to detector materials (solid state), Radiationhard detectors, Si microstrip and pad detectors",
author = "W. Treberspurg and T. Bergauer and M. Dragicevic and M. Krammer and M. Valentan",
year = "2013",
month = apr,
day = "1",
doi = "10.1088/1748-0221/8/04/P04019",
language = "English",
volume = "8",
pages = "P04019",
journal = "Journal of Instrumentation",
issn = "1748-0221",
publisher = "Institute of Physics",
number = "4",
}