Transient electro-thermal simulation of microsystems with space-continuous thermal models in an analogue behavioural simulator

Mirko Jakovljevic; Zeljko Mrcarica; Peter A. Fotiu; Helmut Detter; Vanco Litovski

doi:10.1016/s0026-2714(99)00251-6

Transient electro-thermal simulation of microsystems with space-continuous thermal models in an analogue behavioural simulator

Mirko Jakovljevic, Zeljko Mrcarica, Peter A. Fotiu, Helmut Detter, Vanco Litovski

Fachbereich Applied & Numerical Mechanics

Publikation: Beitrag in Fachzeitschrift › Artikel › peer-review

Originalsprache	Englisch
Seiten (von - bis)	507-516
Seitenumfang	10
Fachzeitschrift	Microelectronics Reliability
Jahrgang	40
Ausgabenummer	3
DOIs	https://doi.org/10.1016/s0026-2714(99)00251-6
Publikationsstatus	Veröffentlicht - 17 März 2000

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10.1016/s0026-2714(99)00251-6

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@article{dda7293b65e841078b283fd51307663b,

title = "Transient electro-thermal simulation of microsystems with space-continuous thermal models in an analogue behavioural simulator",

author = "Mirko Jakovljevic and Zeljko Mrcarica and Fotiu, \{Peter A.\} and Helmut Detter and Vanco Litovski",

year = "2000",

month = mar,

day = "17",

doi = "10.1016/s0026-2714(99)00251-6",

language = "English",

volume = "40",

pages = "507--516",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier Ltd",

number = "3",

}

TY - JOUR

T1 - Transient electro-thermal simulation of microsystems with space-continuous thermal models in an analogue behavioural simulator

AU - Jakovljevic, Mirko

AU - Mrcarica, Zeljko

AU - Fotiu, Peter A.

AU - Detter, Helmut

AU - Litovski, Vanco

PY - 2000/3/17

Y1 - 2000/3/17

UR - https://www.scopus.com/pages/publications/0033894398

U2 - 10.1016/s0026-2714(99)00251-6

DO - 10.1016/s0026-2714(99)00251-6

M3 - Article

AN - SCOPUS:0033894398

SN - 0026-2714

VL - 40

SP - 507

EP - 516

JO - Microelectronics Reliability

JF - Microelectronics Reliability

IS - 3

ER -

Transient electro-thermal simulation of microsystems with space-continuous thermal models in an analogue behavioural simulator

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