Thermal investigations on CMOS integrated micro-hot-plates using IR thermography

Christian Schmidt; Frank Altmann; Giorgio C. Mutinati; Elise Brunet; Stephan Steinhauer; Anton Koeck; Martin Siegele; Christoph Gamauf; Alexander Nemecek; J. Teva; J. Kraft; J. Siegert; F. Schrank; Hans Kruschke

Thermal investigations on CMOS integrated micro-hot-plates using IR thermography

Christian Schmidt, Frank Altmann, Giorgio C. Mutinati, Elise Brunet, Stephan Steinhauer, Anton Koeck, Martin Siegele, Christoph Gamauf, Alexander Nemecek, J. Teva, J. Kraft, J. Siegert, F. Schrank, Hans Kruschke

Fachhochschule Wiener Neustadt GmbH

Publikation: Beitrag in Buch/Bericht/Konferenzband › Konferenzbeitrag › peer-review

1 Zitat (Scopus)

Originalsprache	Englisch
Titel	ISTFA 2012 - Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis
Herausgeber (Verlag)	ASM International
Seiten	592-595
Seitenumfang	4
ISBN (Print)	9781615039791
Publikationsstatus	Veröffentlicht - 2012
Veranstaltung	38th International Symposium for Testing and Failure Analysis, ISTFA 2012 - Phoenix, AZ, USA/Vereinigte Staaten Dauer: 11 Nov. 2012 → 15 Nov. 2012

Publikationsreihe

Name	Conference Proceedings from the International Symposium for Testing and Failure Analysis

Konferenz

Konferenz	38th International Symposium for Testing and Failure Analysis, ISTFA 2012
Land/Gebiet	USA/Vereinigte Staaten
Ort	Phoenix, AZ
Zeitraum	11/11/12 → 15/11/12

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Schmidt, C., Altmann, F., Mutinati, G. C., Brunet, E., Steinhauer, S., Koeck, A., Siegele, M., Gamauf, C., Nemecek, A., Teva, J., Kraft, J., Siegert, J., Schrank, F., & Kruschke, H. (2012). Thermal investigations on CMOS integrated micro-hot-plates using IR thermography. in ISTFA 2012 - Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis (S. 592-595). (Conference Proceedings from the International Symposium for Testing and Failure Analysis). ASM International.

Schmidt, Christian ; Altmann, Frank ; Mutinati, Giorgio C. et al. / Thermal investigations on CMOS integrated micro-hot-plates using IR thermography. ISTFA 2012 - Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis. ASM International, 2012. S. 592-595 (Conference Proceedings from the International Symposium for Testing and Failure Analysis).

@inproceedings{a1c5f589ed654070bc595dbb40e6a5e3,

title = "Thermal investigations on CMOS integrated micro-hot-plates using IR thermography",

author = "Christian Schmidt and Frank Altmann and Mutinati, {Giorgio C.} and Elise Brunet and Stephan Steinhauer and Anton Koeck and Martin Siegele and Christoph Gamauf and Alexander Nemecek and J. Teva and J. Kraft and J. Siegert and F. Schrank and Hans Kruschke",

year = "2012",

language = "English",

isbn = "9781615039791",

series = "Conference Proceedings from the International Symposium for Testing and Failure Analysis",

publisher = "ASM International",

pages = "592--595",

booktitle = "ISTFA 2012 - Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis",

note = "38th International Symposium for Testing and Failure Analysis, ISTFA 2012 ; Conference date: 11-11-2012 Through 15-11-2012",

}

Schmidt, C, Altmann, F, Mutinati, GC, Brunet, E, Steinhauer, S, Koeck, A, Siegele, M, Gamauf, C, Nemecek, A, Teva, J, Kraft, J, Siegert, J, Schrank, F & Kruschke, H 2012, Thermal investigations on CMOS integrated micro-hot-plates using IR thermography. in ISTFA 2012 - Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis. Conference Proceedings from the International Symposium for Testing and Failure Analysis, ASM International, S. 592-595, 38th International Symposium for Testing and Failure Analysis, ISTFA 2012, Phoenix, AZ, USA/Vereinigte Staaten, 11/11/12.

Thermal investigations on CMOS integrated micro-hot-plates using IR thermography. / Schmidt, Christian; Altmann, Frank; Mutinati, Giorgio C. et al.
ISTFA 2012 - Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis. ASM International, 2012. S. 592-595 (Conference Proceedings from the International Symposium for Testing and Failure Analysis).

Publikation: Beitrag in Buch/Bericht/Konferenzband › Konferenzbeitrag › peer-review

TY - GEN

T1 - Thermal investigations on CMOS integrated micro-hot-plates using IR thermography

AU - Schmidt, Christian

AU - Altmann, Frank

AU - Mutinati, Giorgio C.

AU - Brunet, Elise

AU - Steinhauer, Stephan

AU - Koeck, Anton

AU - Siegele, Martin

AU - Gamauf, Christoph

AU - Nemecek, Alexander

AU - Teva, J.

AU - Kraft, J.

AU - Siegert, J.

AU - Schrank, F.

AU - Kruschke, Hans

PY - 2012

Y1 - 2012

UR - http://www.scopus.com/inward/record.url?scp=84874296689&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:84874296689

SN - 9781615039791

T3 - Conference Proceedings from the International Symposium for Testing and Failure Analysis

SP - 592

EP - 595

BT - ISTFA 2012 - Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis

PB - ASM International

T2 - 38th International Symposium for Testing and Failure Analysis, ISTFA 2012

Y2 - 11 November 2012 through 15 November 2012

ER -

Schmidt C, Altmann F, Mutinati GC, Brunet E, Steinhauer S, Koeck A et al. Thermal investigations on CMOS integrated micro-hot-plates using IR thermography. in ISTFA 2012 - Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis. ASM International. 2012. S. 592-595. (Conference Proceedings from the International Symposium for Testing and Failure Analysis).

Thermal investigations on CMOS integrated micro-hot-plates using IR thermography

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