@article{40b478a97c744213b79591adc7e11a77,
title = "Results from a beam test of silicon strip sensors manufactured by Infineon Technologies AG",
keywords = "P-on-n, Planar strip sensor, Semiconductor production, Silicon sensor",
author = "M. Dragicevic and G. Auzinger and U. Bartl and T. Bergauer and S. Gamerith and J. Hacker and A. K{\"o}nig and F. Kr{\"o}ner and E. Kucher and J. Moser and T. Neidhart and Schulze, \{H. J.\} and W. Schustereder and W. Treberspurg and T. W{\"u}bben",
note = "Publisher Copyright: {\textcopyright} 2014 Elsevier B.V.",
year = "2014",
month = nov,
day = "21",
doi = "10.1016/j.nima.2014.04.043",
language = "English",
volume = "765",
pages = "1--6",
journal = "Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment",
issn = "0168-9002",
publisher = "Elsevier B.V.",
}