Results from a beam test of silicon strip sensors manufactured by Infineon Technologies AG

M. Dragicevic; G. Auzinger; U. Bartl; T. Bergauer; S. Gamerith; J. Hacker; A. König; F. Kröner; E. Kucher; J. Moser; T. Neidhart; H. J. Schulze; W. Schustereder; W. Treberspurg; T. Wübben

doi:10.1016/j.nima.2014.04.043

Results from a beam test of silicon strip sensors manufactured by Infineon Technologies AG

M. Dragicevic, G. Auzinger, U. Bartl, T. Bergauer, S. Gamerith, J. Hacker, A. König, F. Kröner, E. Kucher, J. Moser, T. Neidhart, H. J. Schulze, W. Schustereder, W. Treberspurg, T. Wübben

Publikation: Beitrag in Fachzeitschrift › Artikel › peer-review

Originalsprache	Englisch
Seiten (von - bis)	1-6
Seitenumfang	6
Fachzeitschrift	Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Jahrgang	765
DOIs	https://doi.org/10.1016/j.nima.2014.04.043
Publikationsstatus	Veröffentlicht - 21 Nov. 2014
Extern publiziert	Ja

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10.1016/j.nima.2014.04.043

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Dragicevic, M., Auzinger, G., Bartl, U., Bergauer, T., Gamerith, S., Hacker, J., König, A., Kröner, F., Kucher, E., Moser, J., Neidhart, T., Schulze, H. J., Schustereder, W., Treberspurg, W., & Wübben, T. (2014). Results from a beam test of silicon strip sensors manufactured by Infineon Technologies AG. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 765, 1-6. https://doi.org/10.1016/j.nima.2014.04.043

@article{40b478a97c744213b79591adc7e11a77,

title = "Results from a beam test of silicon strip sensors manufactured by Infineon Technologies AG",

keywords = "P-on-n, Planar strip sensor, Semiconductor production, Silicon sensor",

author = "M. Dragicevic and G. Auzinger and U. Bartl and T. Bergauer and S. Gamerith and J. Hacker and A. K{\"o}nig and F. Kr{\"o}ner and E. Kucher and J. Moser and T. Neidhart and Schulze, {H. J.} and W. Schustereder and W. Treberspurg and T. W{\"u}bben",

note = "Publisher Copyright: {\textcopyright} 2014 Elsevier B.V.",

year = "2014",

month = nov,

day = "21",

doi = "10.1016/j.nima.2014.04.043",

language = "English",

volume = "765",

pages = "1--6",

journal = "Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment",

issn = "0168-9002",

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Dragicevic, M, Auzinger, G, Bartl, U, Bergauer, T, Gamerith, S, Hacker, J, König, A, Kröner, F, Kucher, E, Moser, J, Neidhart, T, Schulze, HJ, Schustereder, W, Treberspurg, W & Wübben, T 2014, 'Results from a beam test of silicon strip sensors manufactured by Infineon Technologies AG', Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Jg. 765, S. 1-6. https://doi.org/10.1016/j.nima.2014.04.043

Results from a beam test of silicon strip sensors manufactured by Infineon Technologies AG. / Dragicevic, M.; Auzinger, G.; Bartl, U. et al.
in: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Jahrgang 765, 21.11.2014, S. 1-6.

Publikation: Beitrag in Fachzeitschrift › Artikel › peer-review

TY - JOUR

T1 - Results from a beam test of silicon strip sensors manufactured by Infineon Technologies AG

AU - Dragicevic, M.

AU - Auzinger, G.

AU - Bartl, U.

AU - Bergauer, T.

AU - Gamerith, S.

AU - Hacker, J.

AU - König, A.

AU - Kröner, F.

AU - Kucher, E.

AU - Moser, J.

AU - Neidhart, T.

AU - Schulze, H. J.

AU - Schustereder, W.

AU - Treberspurg, W.

AU - Wübben, T.

PY - 2014/11/21

Y1 - 2014/11/21

KW - P-on-n

KW - Planar strip sensor

KW - Semiconductor production

KW - Silicon sensor

UR - http://www.scopus.com/inward/record.url?scp=84908376109&partnerID=8YFLogxK

U2 - 10.1016/j.nima.2014.04.043

DO - 10.1016/j.nima.2014.04.043

M3 - Article

AN - SCOPUS:84908376109

SN - 0168-9002

VL - 765

SP - 1

EP - 6

JO - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

ER -

Results from a beam test of silicon strip sensors manufactured by Infineon Technologies AG

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