@article{4816608f24694feb96383f5c71539861,
title = "Measuring doping profiles of silicon detectors with a custom-designed probe station",
keywords = "Manufacturing, Radiation damage to detector materials (solid state), Si microstrip and pad detectors",
author = "W. Treberspurg and T. Bergauer and M. Dragicevic and J. Hrubec and M. Krammer and M. Valentan",
year = "2012",
month = nov,
day = "1",
doi = "10.1088/1748-0221/7/11/P11009",
language = "English",
volume = "7",
pages = "P11009",
journal = "Journal of Instrumentation",
issn = "1748-0221",
publisher = "Institute of Physics",
number = "11",
}