Measurement results of different options for spectroscopic X-ray DEPFET sensors

W. Treberspurg; R. Andritschke; G. Hauser; P. Lechner; N. Meidinger; J. Ninkovic; J. Müller-Seidlitz; F. Schopper

doi:10.1088/1748-0221/13/09/P09014

Measurement results of different options for spectroscopic X-ray DEPFET sensors

W. Treberspurg, R. Andritschke, G. Hauser, P. Lechner, N. Meidinger, J. Ninkovic, J. Müller-Seidlitz, F. Schopper

Publikation: Beitrag in Fachzeitschrift › Artikel › peer-review

7 Zitate (Scopus)

Originalsprache	Englisch
Aufsatznummer	P09014
Seiten (von - bis)	P09014
Fachzeitschrift	Journal of Instrumentation
Jahrgang	13
Ausgabenummer	9
DOIs	https://doi.org/10.1088/1748-0221/13/09/P09014
Publikationsstatus	Veröffentlicht - 1 Sept. 2018
Extern publiziert	Ja

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10.1088/1748-0221/13/09/P09014

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@article{1653b349d78f4d7d9b2442c7fa467750,

title = "Measurement results of different options for spectroscopic X-ray DEPFET sensors",

keywords = "Imaging spectroscopy, Instrument optimization, X-ray detectors, X-ray detectors and telescopes",

author = "W. Treberspurg and R. Andritschke and G. Hauser and P. Lechner and N. Meidinger and J. Ninkovic and J. M{\"u}ller-Seidlitz and F. Schopper",

note = "Publisher Copyright: {\textcopyright} 2018 IOP Publishing Ltd and Sissa Medialab.",

year = "2018",

month = sep,

day = "1",

doi = "10.1088/1748-0221/13/09/P09014",

language = "English",

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T1 - Measurement results of different options for spectroscopic X-ray DEPFET sensors

AU - Treberspurg, W.

AU - Andritschke, R.

AU - Hauser, G.

AU - Lechner, P.

AU - Meidinger, N.

AU - Ninkovic, J.

AU - Müller-Seidlitz, J.

AU - Schopper, F.

PY - 2018/9/1

Y1 - 2018/9/1

KW - Imaging spectroscopy

KW - Instrument optimization

KW - X-ray detectors

KW - X-ray detectors and telescopes

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U2 - 10.1088/1748-0221/13/09/P09014

DO - 10.1088/1748-0221/13/09/P09014

M3 - Article

AN - SCOPUS:85055588737

VL - 13

SP - P09014

JO - Journal of Instrumentation

JF - Journal of Instrumentation

IS - 9

M1 - P09014

ER -

Measurement results of different options for spectroscopic X-ray DEPFET sensors

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