@article{f1caadad9bc84a13b2d2da7464d0f2df,
title = "Layout options of spectroscopic X-ray DEPFETs",
keywords = "Detector design and construction technologies and materials, Imaging spectroscopy, Solid state detectors, X-ray detectors and telescopes",
author = "W. Treberspurg and R. Andritschke and A. B{\"a}hr and A. Behrens and G. Hauser and P. Lechner and N. Meidinger and J. M{\"u}ller-Seidlitz and Richter, \{R. H.\} and J. Treis",
note = "Publisher Copyright: {\textcopyright} 2019 IOP Publishing Ltd and Sissa Medialab.",
year = "2019",
month = aug,
day = "7",
doi = "10.1088/1748-0221/14/08/P08008",
language = "English",
volume = "14",
journal = "Journal of Instrumentation",
issn = "1748-0221",
publisher = "Institute of Physics",
number = "8",
}