Erratum: Layout options of spectroscopic X-ray DEPFETs Erratum: Layout options of spectroscopic X-ray DEPFETs: Layout options of spectroscopic X-ray DEPFETs (Astrophysical Journal, Supplement Series (2019) 14 (P08008) DOI: 10.1088/1748-0221/14/08/P08008)

W. Treberspurg; R. Andritschke; A. Bähr; A. Behrens; G. Hauser; P. Lechner; N. Meidinger; J. Müller-Seidlitz; R. H. Richter; J. Treis

doi:10.1088/1748-0221/15/02/e02001

Erratum: Layout options of spectroscopic X-ray DEPFETs Erratum: Layout options of spectroscopic X-ray DEPFETs: Layout options of spectroscopic X-ray DEPFETs (Astrophysical Journal, Supplement Series (2019) 14 (P08008) DOI: 10.1088/1748-0221/14/08/P08008)

W. Treberspurg, R. Andritschke, A. Bähr, A. Behrens, G. Hauser, P. Lechner, N. Meidinger, J. Müller-Seidlitz, R. H. Richter, J. Treis

Publikation: Beitrag in Fachzeitschrift › Kommentar/Debatte

Originalsprache	Englisch
Aufsatznummer	E02001
Seiten (von - bis)	E02001
Fachzeitschrift	Journal of Instrumentation
Jahrgang	15
Ausgabenummer	2
DOIs	https://doi.org/10.1088/1748-0221/15/02/e02001
Publikationsstatus	Veröffentlicht - 7 Feb. 2020
Extern publiziert	Ja

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10.1088/1748-0221/15/02/e02001

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Treberspurg, W., Andritschke, R., Bähr, A., Behrens, A., Hauser, G., Lechner, P., Meidinger, N., Müller-Seidlitz, J., Richter, R. H., & Treis, J. (2020). Erratum: Layout options of spectroscopic X-ray DEPFETs Erratum: Layout options of spectroscopic X-ray DEPFETs: Layout options of spectroscopic X-ray DEPFETs (Astrophysical Journal, Supplement Series (2019) 14 (P08008) DOI: 10.1088/1748-0221/14/08/P08008). Journal of Instrumentation, 15(2), E02001. Artikel E02001. https://doi.org/10.1088/1748-0221/15/02/e02001

Treberspurg, W. ; Andritschke, R. ; Bähr, A. et al. / Erratum: Layout options of spectroscopic X-ray DEPFETs Erratum: Layout options of spectroscopic X-ray DEPFETs : Layout options of spectroscopic X-ray DEPFETs (Astrophysical Journal, Supplement Series (2019) 14 (P08008) DOI: 10.1088/1748-0221/14/08/P08008). in: Journal of Instrumentation. 2020 ; Jahrgang 15, Nr. 2. S. E02001.

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author = "W. Treberspurg and R. Andritschke and A. B{\"a}hr and A. Behrens and G. Hauser and P. Lechner and N. Meidinger and J. M{\"u}ller-Seidlitz and Richter, {R. H.} and J. Treis",

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Treberspurg, W, Andritschke, R, Bähr, A, Behrens, A, Hauser, G, Lechner, P, Meidinger, N, Müller-Seidlitz, J, Richter, RH & Treis, J 2020, 'Erratum: Layout options of spectroscopic X-ray DEPFETs Erratum: Layout options of spectroscopic X-ray DEPFETs: Layout options of spectroscopic X-ray DEPFETs (Astrophysical Journal, Supplement Series (2019) 14 (P08008) DOI: 10.1088/1748-0221/14/08/P08008)', Journal of Instrumentation, Jg. 15, Nr. 2, E02001, S. E02001. https://doi.org/10.1088/1748-0221/15/02/e02001

Erratum: Layout options of spectroscopic X-ray DEPFETs Erratum: Layout options of spectroscopic X-ray DEPFETs: Layout options of spectroscopic X-ray DEPFETs (Astrophysical Journal, Supplement Series (2019) 14 (P08008) DOI: 10.1088/1748-0221/14/08/P08008). / Treberspurg, W.; Andritschke, R.; Bähr, A. et al.
in: Journal of Instrumentation, Jahrgang 15, Nr. 2, E02001, 07.02.2020, S. E02001.

Publikation: Beitrag in Fachzeitschrift › Kommentar/Debatte

TY - JOUR

T1 - Erratum: Layout options of spectroscopic X-ray DEPFETs Erratum: Layout options of spectroscopic X-ray DEPFETs

T2 - Layout options of spectroscopic X-ray DEPFETs (Astrophysical Journal, Supplement Series (2019) 14 (P08008) DOI: 10.1088/1748-0221/14/08/P08008)

AU - Treberspurg, W.

AU - Andritschke, R.

AU - Bähr, A.

AU - Behrens, A.

AU - Hauser, G.

AU - Lechner, P.

AU - Meidinger, N.

AU - Müller-Seidlitz, J.

AU - Richter, R. H.

AU - Treis, J.

PY - 2020/2/7

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DO - 10.1088/1748-0221/15/02/e02001

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SN - 1748-0221

VL - 15

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JO - Journal of Instrumentation

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Treberspurg W, Andritschke R, Bähr A, Behrens A, Hauser G, Lechner P et al. Erratum: Layout options of spectroscopic X-ray DEPFETs Erratum: Layout options of spectroscopic X-ray DEPFETs: Layout options of spectroscopic X-ray DEPFETs (Astrophysical Journal, Supplement Series (2019) 14 (P08008) DOI: 10.1088/1748-0221/14/08/P08008). Journal of Instrumentation. 2020 Feb 7;15(2):E02001. E02001. doi: 10.1088/1748-0221/15/02/e02001