Electro-thermal simulation of microsystems with mixed abstraction modelling

Mirko Jakovljevic; Peter A. Fotiu; Zeljko Mrcarica; Vanco Litovski; Helmut Detter

doi:10.1016/S0026-2714(01)00024-5

Electro-thermal simulation of microsystems with mixed abstraction modelling

Mirko Jakovljevic
, Peter A. Fotiu
, Zeljko Mrcarica
, Vanco Litovski
, Helmut Detter

Institut für Applied Mechanics

TU Wien
NXP Semiconductors
University of Nis

Publikation: Beitrag in Fachzeitschrift › Artikel › peer-review

Originalsprache	Englisch
Seiten (von - bis)	823-835
Seitenumfang	13
Fachzeitschrift	Microelectronics Reliability
Jahrgang	41
Ausgabenummer	6
DOIs	https://doi.org/10.1016/S0026-2714(01)00024-5
Publikationsstatus	Veröffentlicht - Juni 2001

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10.1016/S0026-2714(01)00024-5

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title = "Electro-thermal simulation of microsystems with mixed abstraction modelling",

author = "Mirko Jakovljevic and Fotiu, \{Peter A.\} and Zeljko Mrcarica and Vanco Litovski and Helmut Detter",

year = "2001",

month = jun,

doi = "10.1016/S0026-2714(01)00024-5",

language = "English",

volume = "41",

pages = "823--835",

journal = "Microelectronics Reliability",

issn = "0026-2714",

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TY - JOUR

T1 - Electro-thermal simulation of microsystems with mixed abstraction modelling

AU - Jakovljevic, Mirko

AU - Fotiu, Peter A.

AU - Mrcarica, Zeljko

AU - Litovski, Vanco

AU - Detter, Helmut

PY - 2001/6

Y1 - 2001/6

UR - https://www.scopus.com/pages/publications/0035366077

U2 - 10.1016/S0026-2714(01)00024-5

DO - 10.1016/S0026-2714(01)00024-5

M3 - Article

AN - SCOPUS:0035366077

SN - 0026-2714

VL - 41

SP - 823

EP - 835

JO - Microelectronics Reliability

JF - Microelectronics Reliability

IS - 6

ER -

Electro-thermal simulation of microsystems with mixed abstraction modelling

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