Comparing spreading resistance profiling and C-V characterisation to identify defects in silicon sensors

M. Dragicevic; T. Bergauer; J. Hrubec; M. Krammer; W. Treberspurg; M. Valentan

doi:10.1088/1748-0221/8/02/C02018

Comparing spreading resistance profiling and C-V characterisation to identify defects in silicon sensors

M. Dragicevic, T. Bergauer, J. Hrubec, M. Krammer, W. Treberspurg, M. Valentan

Austrian Academy of Sciences

Publikation: Beitrag in Fachzeitschrift › Artikel › peer-review

Originalsprache	Englisch
Aufsatznummer	C02018
Fachzeitschrift	Journal of Instrumentation
Jahrgang	8
Ausgabenummer	2
DOIs	https://doi.org/10.1088/1748-0221/8/02/C02018
Publikationsstatus	Veröffentlicht - Feb. 2013
Extern publiziert	Ja

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10.1088/1748-0221/8/02/C02018

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title = "Comparing spreading resistance profiling and C-V characterisation to identify defects in silicon sensors",

keywords = "detection of defects, Particle tracking detectors (Solid-state detectors), Solid state detectors",

author = "M. Dragicevic and T. Bergauer and J. Hrubec and M. Krammer and W. Treberspurg and M. Valentan",

year = "2013",

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language = "English",

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journal = "Journal of Instrumentation",

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T1 - Comparing spreading resistance profiling and C-V characterisation to identify defects in silicon sensors

AU - Dragicevic, M.

AU - Bergauer, T.

AU - Hrubec, J.

AU - Krammer, M.

AU - Treberspurg, W.

AU - Valentan, M.

PY - 2013/2

Y1 - 2013/2

KW - detection of defects

KW - Particle tracking detectors (Solid-state detectors)

KW - Solid state detectors

UR - https://www.scopus.com/pages/publications/84875540144

U2 - 10.1088/1748-0221/8/02/C02018

DO - 10.1088/1748-0221/8/02/C02018

M3 - Article

AN - SCOPUS:84875540144

SN - 1748-0221

VL - 8

JO - Journal of Instrumentation

JF - Journal of Instrumentation

IS - 2

M1 - C02018

ER -

Comparing spreading resistance profiling and C-V characterisation to identify defects in silicon sensors

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