@article{66a12590d98e4c23adfa2da4fb958479,
title = "Comparing spreading resistance profiling and C-V characterisation to identify defects in silicon sensors",
keywords = "detection of defects, Particle tracking detectors (Solid-state detectors), Solid state detectors",
author = "M. Dragicevic and T. Bergauer and J. Hrubec and M. Krammer and W. Treberspurg and M. Valentan",
year = "2013",
month = feb,
doi = "10.1088/1748-0221/8/02/C02018",
language = "English",
volume = "8",
journal = "Journal of Instrumentation",
issn = "1748-0221",
publisher = "Institute of Physics",
number = "2",
}